Tuo Tuo Technologies

Miracle Vision 3D Microscopes

Integrated confocal, Extended Depth-of-Field, and White Light Interferometry in one setup — enabling nano-scale 3D surface measurement with exceptional precision.

CAMERA 3D PROFILE MODES: Confocal EDoF WLI
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Overview

The Miracle Vision 3D Microscope Series integrates three powerful measurement modes — Confocal, Extended Depth-of-Field (EDoF), and White Light Interferometry (WLI) — all on a single platform. This unique combination provides nano-scale 3D surface measurement with exceptional precision and versatility.

Designed for high efficiency, pinpoint accuracy, and adaptability across diverse research needs, the Miracle Vision series represents the convergence of cutting-edge optical and precision engineering technologies.

Key Advantages

  • Three measurement modes (Confocal, EDoF, WLI) integrated in one instrument
  • Nano-scale vertical resolution for precise 3D surface profiling
  • Non-contact, non-destructive measurement preserving sample integrity
  • Large field-of-view stitching for mapping extended surfaces
  • Automated measurement routines and comprehensive analysis software
  • Suitable for both R&D and production quality control

Applications

  • Surface roughness and topography analysis
  • Thin-film thickness measurement
  • MEMS and microstructure quality inspection
  • Semiconductor wafer characterization
  • Materials science research
  • Precision manufacturing quality control